Complementary Nanoparticle Characterization by Resistive-Pulse Sensing, Electron Microscopy, and Charge Detection Mass Spectrometry

L.M. Miller, T.W. Young, Y. Wang, B.E. Draper, X. Ye, S.C. Jacobson, and M.F. Jarrold.

Analytical Chemistry, 96, 14239–14247, 2024, https://doi.org/10.1021/acs.analchem.4c02901.